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Determination of carrier recombination velocity at inclined grain boundaries in multicrystalline silicon through photoluminescence imaging and carrier simulation
Mitamura, Kazuki, Kutsukake, Kentaro, Kojima, Takuto, Usami, NoritakaVolume:
128
Journal:
Journal of Applied Physics
DOI:
10.1063/5.0017823
Date:
September, 2020
File:
PDF, 2.91 MB
2020