I see EK: A lightweight technique to reveal exploit kit family by overall URL patterns of infection chains
SÃREN, Emre, ANGIN, Pelin, BAYKAL, NazifeVolume:
27
Journal:
TURKISH JOURNAL OF ELECTRICAL ENGINEERING & COMPUTER SCIENCES
DOI:
10.3906/elk-1810-199
Date:
September, 2019
File:
PDF, 1.49 MB
2019