ANP-based software reliability prediction using PoCs and subsequent employment of orthogonal defect classification measurements for risk mitigation during prototype studies
K. Krishna Mohan, A. Srividya, A. K. VermaVolume:
1
Language:
english
Pages:
6
DOI:
10.1007/s13198-010-0006-9
Date:
March, 2010
File:
PDF, 753 KB
english, 2010