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[IEEE 2020 57th ACM/IEEE Design Automation Conference (DAC) - San Francisco, CA, USA (2020.7.20-2020.7.24)] 2020 57th ACM/IEEE Design Automation Conference (DAC) - Realistic Fault Models and Fault Simulation for Quantum Dot Quantum Circuits
Hsieh, Cheng-Yun, Wu, Chen-Hung, Huang, Chia-Hsien, Goan, His-Sheng, Mo Li, James ChienYear:
2020
DOI:
10.1109/DAC18072.2020.9218573
File:
PDF, 1.88 MB
2020