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[IEEE 2020 57th ACM/IEEE Design Automation Conference (DAC) - San Francisco, CA, USA (2020.7.20-2020.7.24)] 2020 57th ACM/IEEE Design Automation Conference (DAC) - Accurate Inference with Inaccurate RRAM Devices: Statistical Data, Model Transfer, and On-line Adaptation
Charan, Gouranga, Hazra, Jubin, Beckmann, Karsten, Du, Xiaocong, Krishnan, Gokul, Joshi, Rajiv V., Cady, Nathaniel C., Cao, YuYear:
2020
DOI:
10.1109/DAC18072.2020.9218605
File:
PDF, 3.15 MB
2020