Optical properties of thickness-controlled PtSe 2 thin films studied via spectroscopic ellipsometry
He, Junbo, Jiang, Wei, Zhu, Xudan, Zhang, Rongjun, Wang, Jianlu, Zhu, Mei-Ping, Wang, Songyou, Zheng, Y. X., Chen, LiangyaoYear:
2020
Journal:
Physical Chemistry Chemical Physics
DOI:
10.1039/D0CP04021E
File:
PDF, 1.79 MB
2020