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Modeling of Current Mismatch and 1/ f Noise for Halo-Implanted Drain-Extended MOSFETs
Gupta, Chetan, Dey, Sagnik, Goel, Ravi, Hu, Chenming, Chauhan, Yogesh SinghVolume:
67
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2020.3027268
Date:
November, 2020
File:
PDF, 1.32 MB
2020