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Correction of height-fluctuation-induced systematic errors in polymers by AFM-based nanomechanical measurements
Mao, Lu, Fujinami, So, Liu, Wentao, Liu, Hao, Nakajima, KenVolume:
93
Journal:
Polymer Testing
DOI:
10.1016/j.polymertesting.2020.106919
Date:
January, 2021
File:
PDF, 3.98 MB
2021