[IEEE 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) - Vienna, Austria (2020.9.8-2020.9.11)] 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) - Deep Learning based Condition Monitoring approach applied to Power Quality
Gonzalez-Abreu, Artvin-Darien, Saucedo-Dorantes, Juan-Jose, Osornio-Rios, Roque-Alfredo, Arellano-Espitia, Francisco, Delgado-Prieto, MiguelYear:
2020
DOI:
10.1109/ETFA46521.2020.9212076
File:
PDF, 788 KB
2020