7‐2: Invited Paper: Hot...

SID Symposium Digest of Technical Papers 2020 / 08 Vol. 51; Iss. 1

7‐2: Invited Paper: Hot Carrier Degradation in High Mobility Metal Oxide Thin Film Transistors

Uraoka, Yukiharu, Takahashi, Takanori, Kise, Kahori, Bermundo, Juan Paolo, Fujii, Mami N., Uenuma, Mutsunori, Ishikawa, Yasuaki
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Volume:
51
Journal:
SID Symposium Digest of Technical Papers
DOI:
10.1002/sdtp.13807
Date:
August, 2020
File:
PDF, 1.68 MB
2020
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