[IEEE 2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2020.8.10-2020.8.13)] 2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - TaOx ReRAM as a Highly-Reliable Embedded Memory and Its Application to Edge AI
Yasuhara, RyutaroYear:
2020
DOI:
10.1109/VLSI-DAT49148.2020.9196326
File:
PDF, 467 KB
2020