[IEEE 2020 American Control Conference (ACC) - Denver, CO,...

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[IEEE 2020 American Control Conference (ACC) - Denver, CO, USA (2020.7.1-2020.7.3)] 2020 American Control Conference (ACC) - Market Approach to Length Constrained Min-Max Multiple Depot Multiple Traveling Salesman Problem

Scott, Drew, Manyam, Satyanarayana G., Casbeer, David W., Kumar, Manish
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Year:
2020
DOI:
10.23919/ACC45564.2020.9147207
File:
PDF, 307 KB
2020
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