![](/img/cover-not-exists.png)
Systematic Investigation of Structure and Optoelectronic Properties of Ge (n=3-20), MGe9 (M=Ga, Si, Sn, As) and GaxGe(10-x) (x=1-10) Clusters: Computational Approach
Mahdavifar, Zabiollah, Afshari, Mina, Bagheri, Ahmad, Arab, AliJournal:
Polyhedron
DOI:
10.1016/j.poly.2020.114874
Date:
October, 2020
File:
PDF, 1.89 MB
2020