20‐4: Study on the Effect of OLED Device Lifetime...

SID Symposium Digest of Technical Papers 2020 / 08 Vol. 51; Iss. 1

20‐4: Study on the Effect of OLED Device Lifetime Improvement according to Hole Injection Barrier and p‐Dopants

Hong, Jaechul, Kang, Yoonsu, Lee, Jinyoung, Jeong, Seungjae, Ahn, Jaehong, Chu, Changwoong
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Volume:
51
Journal:
SID Symposium Digest of Technical Papers
DOI:
10.1002/sdtp.13860
Date:
August, 2020
File:
PDF, 686 KB
2020
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