XAFS and TEM Investigation of Nanocluster Formation in...

  • Main
  • 2020 / 09
  • XAFS and TEM Investigation of Nanocluster Formation in...

XAFS and TEM Investigation of Nanocluster Formation in 64Zn+ Ion-Implanted and Thermo-Oxidized SiO2 Film

Khramov, E. V., Privezentsev, V. V., Palagushkin, A. N., Shcherbachev, K. D., Tabachkova, N. Yu.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-020-08454-7
Date:
September, 2020
File:
PDF, 1.84 MB
2020
Conversion to is in progress
Conversion to is failed