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[IEEE 2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2020.8.10-2020.8.13)] 2020 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Low-Active-Energy and Low-Standby-Power Sub-threshold ROM for IoT Edge Sensing Systems
Wang, Jinn-Shyan, Liu, Chien-Tung, Wang, Chao-HsiangYear:
2020
DOI:
10.1109/VLSI-DAT49148.2020.9196482
File:
PDF, 830 KB
2020