A Method for Series-Resistance-Immune Extraction of...

IEEE Transactions on Electron Devices 2020 / 11 Vol. 67; Iss. 11

A Method for Series-Resistance-Immune Extraction of Low-Frequency Noise Parameters in Nanoscale MOSFETs

Tataridou, Angeliki, Ghibaudo, Gerard, Theodorou, Christoforos
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Volume:
67
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2020.3026612
Date:
November, 2020
File:
PDF, 1.14 MB
2020
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