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Position Normalization as a Tool to Extract Compositional and Microstructural Profiles from Backscatter and Secondary Electron Images
Lee, P. J., Larbalestier, D. CVolume:
6
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927600037624
Date:
August, 2000
File:
PDF, 2.23 MB
2000