[AIP The 6th workshop on beam instrumentation - Vancouver, British Columbia (Canada) (3â6 Oct 1994)] AIP Conference Proceedings - Rotating scanning polarization profile monitor
Soukup, J., Green, P. W., Holm, L., Korkmaz, E., Mullin, S., Roy, G., Stocki, and T., Berdoz, A. R., Birchal, J., Campbell, J. R., Hamian, A. A., Page, S. A., Ramsay, W. D., Reitzner, S. D., SekulovicVolume:
333
Year:
1995
DOI:
10.1063/1.48075
File:
PDF, 720 KB
1995