[IEEE 2020 IEEE International Conference on Electro Information Technology (EIT) - Chicago, IL, USA (2020.7.31-2020.8.1)] 2020 IEEE International Conference on Electro Information Technology (EIT) - A Screen-Printed Nickel Based Resistance Temperature Detector (RTD) on Thin Ceramic Substrate
Turkani, Vikram S., Maddipatla, Dinesh, Narakathu, Binu B., Altay, Bilge N., Fleming, Dan, Bazuin, Bradley J., Atashbar, Massood Z.Year:
2020
DOI:
10.1109/EIT48999.2020.9208252
File:
PDF, 598 KB
2020