[IEEE 2019 3rd International Conference on Radiation...

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[IEEE 2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED) - Chongqing, China (2019.5.29-2019.5.31)] 2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED) - Evaluation of SEU Sensitivity in Hardened FPGA on Layout-based Sensitive Volume Method

Cai, Chang, Ding, Luchang, Chen, Gengsheng, Liu, Tianqi, Li, Dongqing, Zhao, Peixiong, He, Ze, Ye, Bing, Liu, Jie
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Year:
2019
DOI:
10.1109/ICREED49760.2019.9205163
File:
PDF, 1.76 MB
2019
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