Inaccurate Switching Loss Measurement of SiC MOSFET Caused...

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IEEE Transactions on Instrumentation and Measurement 2020

Inaccurate Switching Loss Measurement of SiC MOSFET Caused by Probes: Modelization, Characterization, and Validation

Zeng, Zheng, Wang, Jin, Wang, Liang, Yu, Yue, Ou, Kaihong
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Year:
2020
Journal:
IEEE Transactions on Instrumentation and Measurement
DOI:
10.1109/TIM.2020.3024356
File:
PDF, 5.38 MB
2020
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