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Investigating the Current Collapse Mechanisms of p-GaN Gate HEMTs by Different Passivation Dielectrics
Li, Xiangdong, Posthuma, Niels, Bakeroot, Benoit, Liang, Hu, You, Shuzhen, Wu, Zhicheng, Zhao, Ming, Groeseneken, Guido, Decoutere, StefaanYear:
2020
Journal:
IEEE Transactions on Power Electronics
DOI:
10.1109/TPEL.2020.3031680
File:
PDF, 743 KB
2020