A Step-Down Test Procedure for Wavelet Shrinkage Using Bootstrapping
Lim, Munwon, Omitaomu, Olufemi A., Bae, Suk JooVolume:
8
Year:
2020
Journal:
IEEE Access
DOI:
10.1109/access.2020.3025103
File:
PDF, 4.01 MB
2020