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[IEEE 2020 57th ACM/IEEE Design Automation Conference (DAC) - San Francisco, CA, USA (2020.7.20-2020.7.24)] 2020 57th ACM/IEEE Design Automation Conference (DAC) - Stealing Your Data from Compressed Machine Learning Models
Xu, Nuo, Liu, Qi, Liu, Tao, Liu, Zihao, Guo, Xiaochen, Wen, WujieYear:
2020
DOI:
10.1109/dac18072.2020.9218633
File:
PDF, 5.00 MB
2020