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[IEEE 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) - Vienna, Austria (2020.9.8-2020.9.11)] 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) - Analytic method for automatic test case generation for Function Block Diagram
Ausberger, Tomas, Kubicek, Karel, Medvecova, Pavla, Myslivec, Tomas, Stetina, MilanYear:
2020
DOI:
10.1109/etfa46521.2020.9212034
File:
PDF, 439 KB
2020