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[IEEE 2020 IEEE East-West Design & Test Symposium (EWDTS) - Varna, Bulgaria (2020.9.4-2020.9.7)] 2020 IEEE East-West Design & Test Symposium (EWDTS) - Hardware-based Capture-The-Flag Challenges
PRINETTO, Paolo, ROASCIO, Gianluca, VARRIALE, AntonioYear:
2020
DOI:
10.1109/ewdts50664.2020.9224932
File:
PDF, 162 KB
2020