[IEEE 2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED) - Chongqing, China (2019.5.29-2019.5.31)] 2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED) - Compton Scattering Pinhole Imaging Technology for Measuring and Diagnosing Dose Field Intensity Distribution of Intense Pulse Gamma Ray Beams

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