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[IEEE 2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED) - Chongqing, China (2019.5.29-2019.5.31)] 2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED) - Compton Scattering Pinhole Imaging Technology for Measuring and Diagnosing Dose Field Intensity Distribution of Intense Pulse Gamma Ray Beams
Xiaohai, Zheng, Huasi, Hu, Jianfeng, Sun, Zhongliang, Li, Dan, Cai, Jinhua, WangYear:
2019
DOI:
10.1109/icreed49760.2019.9205167
File:
PDF, 1.70 MB
2019