[IEEE 2019 3rd International Conference on Radiation...

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[IEEE 2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED) - Chongqing, China (2019.5.29-2019.5.31)] 2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED) - A Radiation-hardened Bus Controller Chip for ARINC 659

Jiang, Shuang, Liu, Shibin, Guo, Chenguang, Ma, Teng, Paccagnella, Alessandro, Xie, Jialan
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Year:
2019
DOI:
10.1109/icreed49760.2019.9205170
File:
PDF, 647 KB
2019
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