![](/img/cover-not-exists.png)
[IEEE 2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED) - Chongqing, China (2019.5.29-2019.5.31)] 2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED) - A Radiation-hardened Bus Controller Chip for ARINC 659
Jiang, Shuang, Liu, Shibin, Guo, Chenguang, Ma, Teng, Paccagnella, Alessandro, Xie, JialanYear:
2019
DOI:
10.1109/icreed49760.2019.9205170
File:
PDF, 647 KB
2019