![](/img/cover-not-exists.png)
[IEEE 2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED) - Chongqing, China (2019.5.29-2019.5.31)] 2019 3rd International Conference on Radiation Effects of Electronic Devices (ICREED) - The Time-dependent latch-up defect induced by single-particles in bulk CMOS
Wanjun, YIN, Yukui, LIU, Yukai, ZHU, Xue, WUYear:
2019
DOI:
10.1109/icreed49760.2019.9205171
File:
PDF, 2.05 MB
2019