[IEEE 2020 IEEE International Test Conference in Asia (ITC-Asia) - Taipei, Taiwan (2020.9.23-2020.9.25)] 2020 IEEE International Test Conference in Asia (ITC-Asia) - High Efficiency and Low Overkill Testing for Probabilistic Circuits
Lee, Ming-Ting, Wu, Chen-Hung, Liu, Shi-Tang, Hsieh, Cheng-Yun, Li, James Chien-MoYear:
2020
DOI:
10.1109/itc-asia51099.2020.00026
File:
PDF, 393 KB
2020