[IEEE 2020 IEEE International Test Conference in Asia...

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[IEEE 2020 IEEE International Test Conference in Asia (ITC-Asia) - Taipei, Taiwan (2020.9.23-2020.9.25)] 2020 IEEE International Test Conference in Asia (ITC-Asia) - High Efficiency and Low Overkill Testing for Probabilistic Circuits

Lee, Ming-Ting, Wu, Chen-Hung, Liu, Shi-Tang, Hsieh, Cheng-Yun, Li, James Chien-Mo
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Year:
2020
DOI:
10.1109/itc-asia51099.2020.00026
File:
PDF, 393 KB
2020
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