[IEEE 2020 International Workshop on Electronic Communication and Artificial Intelligence (IWECAI) - Shanghai, China (2020.6.12-2020.6.14)] 2020 International Workshop on Electronic Communication and Artificial Intelligence (IWECAI) - Junction Temperature Measurement of IGBT in Accelerated Degradation Test
Li, Yaosheng, Chen, Zhongyuan, Li, Jinyuan, Guo, ChunshengYear:
2020
DOI:
10.1109/iwecai50956.2020.00008
File:
PDF, 473 KB
2020