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[IEEE 2020 International Workshop on Electronic Communication and Artificial Intelligence (IWECAI) - Shanghai, China (2020.6.12-2020.6.14)] 2020 International Workshop on Electronic Communication and Artificial Intelligence (IWECAI) - Junction Temperature Measurement of IGBT in Accelerated Degradation Test

Li, Yaosheng, Chen, Zhongyuan, Li, Jinyuan, Guo, Chunsheng
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Year:
2020
DOI:
10.1109/iwecai50956.2020.00008
File:
PDF, 473 KB
2020
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