Ionization Damage Effects of Pulse Discharge Circuit...

IEEE Journal of the Electron Devices Society 2020 Vol. 8

Ionization Damage Effects of Pulse Discharge Circuit Switched by Anode-Short MOS-Controlled Thyristor

Li, Lei, Li, Ze-Hong, Zhang, Jin-Ping, Wu, Yu-Zhou, Chen, Xiao-Chi, Min-Ren,, Zhang, Bo, Jian, Yuan
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Volume:
8
Year:
2020
Journal:
IEEE Journal of the Electron Devices Society
DOI:
10.1109/jeds.2020.3030880
File:
PDF, 511 KB
2020
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