Electrically Erasable Optical I/O for Wafer Scale Testing...

IEEE Photonics Journal 2020 / 10 Vol. 12; Iss. 5

Electrically Erasable Optical I/O for Wafer Scale Testing of Silicon Photonic Integrated Circuits

Yu, Xingshi, Chen, Xia, Milosevic, Milan M., Yan, Xingzhao, Saito, Shinichi, Reed, Graham T.
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Volume:
12
Journal:
IEEE Photonics Journal
DOI:
10.1109/jphot.2020.3027799
Date:
October, 2020
File:
PDF, 2.44 MB
2020
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