President's message: Special issue highlighting AUTOTESTCON...

IEEE Instrumentation & Measurement Magazine 2020 / 8 Vol. 23; Iss. 5

President's message: Special issue highlighting AUTOTESTCON 2019

Baglio, Salvo, Downing, Walter
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Volume:
23
Journal:
IEEE Instrumentation & Measurement Magazine
DOI:
10.1109/mim.2020.9153466
Date:
August, 2020
File:
PDF, 167 KB
2020
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