Reliability-Aware Statistical BSIM Compact Model Parameter...

IEEE Transactions on Electron Devices 2020 / 11 Vol. 67; Iss. 11

Reliability-Aware Statistical BSIM Compact Model Parameter Generation Methodology

Ding, Jie, Asenov, Asen
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Volume:
67
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/ted.2020.3026614
Date:
November, 2020
File:
PDF, 3.81 MB
2020
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