Clone Detection Based on BPNN and Physical Layer Reputation...

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IEEE Transactions on Industrial Informatics 2020

Clone Detection Based on BPNN and Physical Layer Reputation for Industrial Wireless CPS

Pan, Fei, Wen, Hong, Gao, Xuesong, Pu, Haibo, Pang, Zhibo
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Year:
2020
Journal:
IEEE Transactions on Industrial Informatics
DOI:
10.1109/tii.2020.3028120
File:
PDF, 4.60 MB
2020
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