Fault Detection for Covered Conductors With High-Frequency...

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Fault Detection for Covered Conductors With High-Frequency Voltage Signals: From Local Patterns to Global Features

Chen, Kunjin, Vantuch, Tomas, Zhang, Yu, Hu, Jun, He, Jinliang
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Year:
2020
Journal:
IEEE Transactions on Smart Grid
DOI:
10.1109/tsg.2020.3032527
File:
PDF, 11.68 MB
2020
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