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Effects of hot-carrier degradation on the low frequency noise in strained-Si p-MOSFETs
Das, Sanghamitra, Dash, T.P., Maiti, Chinmay K.Volume:
10
Year:
2018
Journal:
International Journal of Nanoparticles
DOI:
10.1504/ijnp.2018.092677
File:
PDF, 585 KB
2018