Non-destructive identification of slightly sprouted wheat...

Biosystems Engineering 2020 / 12 Vol. 200

Non-destructive identification of slightly sprouted wheat kernels using hyperspectral data on both sides of wheat kernels

Zhang, Liu, Sun, Heng, Rao, Zhenhong, Ji, Haiyan
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Volume:
200
Journal:
Biosystems Engineering
DOI:
10.1016/j.biosystemseng.2020.10.004
Date:
December, 2020
File:
PDF, 1.30 MB
2020
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