Vector Electrometry in a Wide-Gap-Semiconductor Device...

Vector Electrometry in a Wide-Gap-Semiconductor Device Using a Spin-Ensemble Quantum Sensor

Yang, Bang, Murooka, Takuya, Mizuno, Kosuke, Kim, Kwangsoo, Kato, Hiromitsu, Makino, Toshiharu, Ogura, Masahiko, Yamasaki, Satoshi, Schmidt, Marek E., Mizuta, Hiroshi, Yacoby, Amir, Hatano, Mutsuko, I
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Volume:
14
Journal:
Physical Review Applied
DOI:
10.1103/PhysRevApplied.14.044049
Date:
October, 2020
File:
PDF, 2.20 MB
2020
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