[IEEE 2020 57th ACM/IEEE Design Automation Conference (DAC) - San Francisco, CA, USA (2020.7.20-2020.7.24)] 2020 57th ACM/IEEE Design Automation Conference (DAC) - PIM-Prune: Fine-Grain DCNN Pruning for Crossbar-Based Process-In-Memory Architecture
Chu, Chaoqun, Wang, Yanzhi, Zhao, Yilong, Ma, Xiaolong, Ye, Shaokai, Hong, Yunyan, Liang, Xiaoyao, Han, Yinhe, Jiang, LiYear:
2020
DOI:
10.1109/dac18072.2020.9218523
File:
PDF, 1.30 MB
2020