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[IEEE 2020 IEEE Sensors Applications Symposium (SAS) - Kuala Lumpur, Malaysia (2020.3.9-2020.3.11)] 2020 IEEE Sensors Applications Symposium (SAS) - Metrology in eye pressure measurements
Pavlasek, Peter, Rybar, Jan, Duris, Stanislav, Hucko, Branislav, Palencar, Jakub, Chytil, MiroslavYear:
2020
DOI:
10.1109/sas48726.2020.9220014
File:
PDF, 907 KB
2020