![](/img/cover-not-exists.png)
X-ray irradiation-induced degradation in Hf0.5Zr0.5O2 fully depleted silicon-on-insulator n-type metal oxide semiconductor field-effect transistors
Li, Yu-Dong, Zhang, Qing-Zhu, Liu, Fan-Yu, Zhang, Zhao-Hao, Zhang, Feng-Yuan, Zhao, Hong-Bin, Li, Bo, Yan, JiangJournal:
Rare Metals
DOI:
10.1007/s12598-020-01586-z
Date:
September, 2020
File:
PDF, 1.54 MB
2020