ENO and WENO schemes using arc-length based smoothness...

ENO and WENO schemes using arc-length based smoothness measurement

Biswas, Biswarup, Dubey, Ritesh Kumar
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Volume:
80
Journal:
Computers & Mathematics with Applications
DOI:
10.1016/j.camwa.2020.10.005
Date:
December, 2020
File:
PDF, 1.76 MB
2020
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