Development of the Silicon Drift Detector for Electron...

Microscopy Today 2020 / 09 Vol. 28; Iss. 5

Development of the Silicon Drift Detector for Electron Microscopy Applications

Strüder, Lothar, Niculae, Adrian, Holl, Peter, Soltau, Heike
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
28
Journal:
Microscopy Today
DOI:
10.1017/S1551929520001327
Date:
September, 2020
File:
PDF, 6.37 MB
2020
Conversion to is in progress
Conversion to is failed