A Brewster incidence method for shocked dynamic metrology...

AIP Advances 2020 / 10 Vol. 10; Iss. 10

A Brewster incidence method for shocked dynamic metrology of transparent materials and its error evaluation

Zhong, Zhicheng, Zhang, Lin, Jiang, Hao, Gong, Wenqi, Gu, Honggang, Chen, Xiuguo, Liu, Shiyuan
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Volume:
10
Journal:
AIP Advances
DOI:
10.1063/5.0023819
Date:
October, 2020
File:
PDF, 3.92 MB
2020
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