Scaling analyses on the critical current density in MgB 2 /SiC/Si thin film processed at higher temperature
Nishida, Akihiko, Taka, Chihiro, Chromik, StefanVolume:
502
Journal:
IOP Conference Series: Materials Science and Engineering
DOI:
10.1088/1757-899x/502/1/012184
Date:
April, 2019
File:
PDF, 372 KB
2019