[IEEE 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) - Vienna, Austria (2020.9.8-2020.9.11)] 2020 25th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) - 3D Mapping of X-Ray Images in Inspections of Aerospace Parts
Evangelista, Daniele, Terreran, Matteo, Pretto, Alberto, Moro, Michele, Ferrari, Carlo, Menegatti, EmanueleYear:
2020
DOI:
10.1109/ETFA46521.2020.9212135
File:
PDF, 484 KB
2020