[IEEE 2020 8th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) - Noida, India (2020.6.4-2020.6.5)] 2020 8th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) - Feature Extraction to Heterogeneous Cross Project Defect Prediction
Vashisht, Rohit, Rizvi, Syed Afzal MurtazaYear:
2020
DOI:
10.1109/ICRITO48877.2020.9197799
File:
PDF, 232 KB
2020